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Matthew J Burch

Showing results (1-10 of 10) with videos related to

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Micron (Oxford, England : 1993)|October 19, 2023
Multi-scale pore network modelling to evaluate connectivity in ceramic compositesJoan Widin Schroeder, Matthew J Burch, Mario A Perez
Journal of Microscopy|December 7, 2021
Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffractionChris M Fancher, Matthew J Burch, Srikanth Patala, et al.
Ultramicroscopy|December 2, 2016
Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulationsMatthew J Burch, Chris M Fancher, Srikanth Patala, et al.
Analytical Chemistry|December 12, 2017
Helium Ion Microscopy for Imaging and Quantifying Porosity at the NanoscaleMatthew J Burch, Anton V Ievlev, Kyle Mahady, et al.
Analytical Chemistry|January 31, 2018
Chemical Phenomena of Atomic Force Microscopy ScanningAnton V Ievlev, Chance Brown, Matthew J Burch, et al.
Nanoscale|September 19, 2018
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imagingNikolay Borodinov, Alex Belianinov, Dongsook Chang, et al.
Nanoscale|August 24, 2017
Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopyAnton V Ievlev, Jacek Jakowski, Matthew J Burch, et al.
Micromachines|May 28, 2020
Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced DepositionAlex Belianinov, Matthew J Burch, Anton Ievlev, et al.
Scientific Reports|December 2, 2017
Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion BeamAlex Belianinov, Matthew J Burch, Holland E Hysmith, et al.
Nature Communications|June 28, 2017
Engineering the thermal conductivity along an individual silicon nanowire by selective helium ion irradiationYunshan Zhao, Dan Liu, Jie Chen, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Micron (Oxford, England : 1993)|October 19, 2023
Multi-scale pore network modelling to evaluate connectivity in ceramic compositesJoan Widin Schroeder, Matthew J Burch, Mario A Perez
Journal of Microscopy|December 7, 2021
Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffractionChris M Fancher, Matthew J Burch, Srikanth Patala, et al.
Ultramicroscopy|December 2, 2016
Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulationsMatthew J Burch, Chris M Fancher, Srikanth Patala, et al.
Analytical Chemistry|December 12, 2017
Helium Ion Microscopy for Imaging and Quantifying Porosity at the NanoscaleMatthew J Burch, Anton V Ievlev, Kyle Mahady, et al.
Analytical Chemistry|January 31, 2018
Chemical Phenomena of Atomic Force Microscopy ScanningAnton V Ievlev, Chance Brown, Matthew J Burch, et al.
Nanoscale|September 19, 2018
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imagingNikolay Borodinov, Alex Belianinov, Dongsook Chang, et al.
Nanoscale|August 24, 2017
Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopyAnton V Ievlev, Jacek Jakowski, Matthew J Burch, et al.
Micromachines|May 28, 2020
Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced DepositionAlex Belianinov, Matthew J Burch, Anton Ievlev, et al.
Scientific Reports|December 2, 2017
Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion BeamAlex Belianinov, Matthew J Burch, Holland E Hysmith, et al.
Nature Communications|June 28, 2017
Engineering the thermal conductivity along an individual silicon nanowire by selective helium ion irradiationYunshan Zhao, Dan Liu, Jie Chen, et al.
Pageof 1