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Optics Express|November 26, 2008
Geometrical analysis of third-order aberrations for a solid immersion lensMatthew Lang, Eric Aspnes, Tom D MilsterApplied Optics|March 24, 2009
Optical force model based on sequential ray tracingEric Aspnes, Tom D Milster, Koen VisscherOptics Letters|October 20, 2009
Effect of fractal rough-surface Hurst exponent on speckle in imaging systemsDongyel Kang, Tom D MilsterJournal of the Optical Society of America. A, Optics, Image Science, and Vision|December 4, 2009
Effect of optical aberration on Gaussian speckle in a partially coherent imaging systemDongyel Kang, Tom D MilsterApplied Optics|July 22, 2010
Characteristics of a scanning nano-slit image sensor for line-and-space patternsAnoop George, Tom D MilsterOptics Express|June 18, 2009
Properties of induced polarization evanescent reflection with a solid immersion lens (SIL)Tao Chen, Tom D MilsterJournal of the Optical Society of America. A, Optics, Image Science, and Vision|September 2, 2009
Simulation method for non-Gaussian speckle in a partially coherent systemDongyel Kang, Tom D MilsterOptics Letters|November 2, 2019
Single-shot phase retrieval with complex diversityAkira Eguchi, Tom D MilsterApplied Optics|August 23, 2011
Spot distribution measurement using a scanning nanoslitAnoop George, Tom D MilsterOptics Express|June 25, 2009
Proposal of three-dimensional phase contrast holographic microscopyNaoki Fukutake, Tom D MilsterPageof 4