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Optics Express|October 14, 2022
High-resolution, wavefront-sensing, full-field polarimetry of arbitrary beams using phase retrievalMatthew N Jacobs, Yuka Esashi, Nicholas W Jenkins, et al.
Science Advances|February 11, 2021
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometryMichael Tanksalvala, Christina L Porter, Yuka Esashi, et al.
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