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Optics Express|March 26, 2014
Absolute flatness measurement using oblique incidence setup and an iterative algorithm. A demonstration on synthetic dataMaurizio VannoniOptics Express|June 4, 2008
Absolute planarity with three-flat test: an iterative approach with Zernike polynomialsMaurizio Vannoni, Giuseppe MolesiniApplied Optics|April 22, 2008
Three-flat test with plates in horizontal postureMaurizio Vannoni, Giuseppe MolesiniOptics Express|June 24, 2009
Iterative algorithm for three flat testMaurizio Vannoni, Giuseppe MolesiniOptics Express|November 3, 2017
Absolute, high-accuracy characterization of a variable line spacing grating for the European XFEL soft X-ray monochromatorMaurizio Vannoni, Idoia Freijo-MartinOptics Express|April 15, 2010
Long-term deformation at room temperature observed in fused silicaMaurizio Vannoni, Andrea Sordini, Giuseppe MolesiniJournal of Synchrotron Radiation|July 1, 2016
Characterization of an X-ray mirror mechanical bender for the European XFELMaurizio Vannoni, Idoia Freijo Martín, Harald SinnOptics Express|July 28, 2016
Calibration and optimization of an x-ray bendable mirror using displacement-measuring sensorsMaurizio Vannoni, Idoia Freijo Martín, Valerija Music, et al.The European Physical Journal. E, Soft Matter|February 25, 2014
Monitoring the thinning dynamics of soap films by phase shift interferometry. The case of perfluoropolyether surfactantsCecilia M C Gambi, Maurizio Vannoni, Andrea Sordini, et al.Optics Express|October 10, 2013
Measuring the thickness of soap bubbles with phase-shift interferometryMaurizio Vannoni, Andrea Sordini, Riccardo Gabrieli, et al.Pageof 3