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The Review of Scientific Instruments
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December 2, 2011
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Till Hagedorn, Mehdi El Ouali, William Paul, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
November 7, 2012
Conductivity of an atomically defined metallic interface
David J Oliver, Jesse Maassen, Mehdi El Ouali, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
The Review of Scientific Instruments
|
December 2, 2011
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Till Hagedorn, Mehdi El Ouali, William Paul, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
November 7, 2012
Conductivity of an atomically defined metallic interface
David J Oliver, Jesse Maassen, Mehdi El Ouali, et al.
Page
of 1