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Ultramicroscopy
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May 23, 2020
A general and robust analytical method for interface normal determination in TEM
Rui-Xun Xie, Melvyn Larranaga, Frédéric Mompiou, et al.
Plos One
|
November 19, 2019
3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods
Ye Wei, Zirong Peng, Markus Kühbach, et al.
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Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
May 23, 2020
A general and robust analytical method for interface normal determination in TEM
Rui-Xun Xie, Melvyn Larranaga, Frédéric Mompiou, et al.
Plos One
|
November 19, 2019
3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods
Ye Wei, Zirong Peng, Markus Kühbach, et al.
Page
of 1