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Journal of Physics. Condensed Matter : an Institute of Physics Journal|January 10, 2019
Using first principles calculations to interpret XANES experiments: extracting the size-dependence of the (p , T) phase diagram of sub-nanometer Cu clusters in an O2 environmentNisha Mammen, Leonardo Spanu, Eric C Tyo, et al.
Rapid Communications in Mass Spectrometry : RCM|September 8, 2012
High-resolution secondary ion mass spectrometry depth profiling of nanolayersSergey V Baryshev, Alexander V Zinovev, C Emil Tripa, et al.
Analytical Chemistry|July 31, 2004
Derivatization of surface-bound peptides for mass spectrometric detection via threshold single photon ionizationPraneeth D Edirisinghe, Syed S Lateef, Carrie A Crot, et al.
ACS Applied Materials & Interfaces|May 16, 2014
High-surface-area architectures for improved charge transfer kinetics at the dark electrode in dye-sensitized solar cellsWilliam L Hoffeditz, Michael J Katz, Pravas Deria, et al.
The Journal of Chemical Physics|March 2, 2020
Structural reversibility of Cu doped NU-1000 MOFs under hydrogenation conditionsAvik Halder, Sungsik Lee, Bing Yang, et al.
ACS Applied Materials & Interfaces|July 22, 2014
Real-time observation of atomic layer deposition inhibition: metal oxide growth on self-assembled alkanethiolsJason R Avila, Erica J DeMarco, Jonathan D Emery, et al.
Chemsuschem|October 8, 2016
Water Oxidation by Size-Selected Co27 Clusters Supported on Fe2 O3Michael J Pellin, Shannon C Riha, Eric C Tyo, et al.
ACS Applied Materials & Interfaces|January 20, 2016
Atomic Layer Deposition of MnS: Phase Control and Electrochemical ApplicationsShannon C Riha, Alexandra A Koegel, Xiangbo Meng, et al.
ACS Nano|February 13, 2013
Atomic layer deposition of a submonolayer catalyst for the enhanced photoelectrochemical performance of water oxidation with hematiteShannon C Riha, Benjamin M Klahr, Eric C Tyo, et al.
The Journal of Physical Chemistry. B|June 28, 2006
Imaging of atomic layer deposited (ALD) tungsten monolayers on alpha-TiO2(110) by X-ray standing wave Fourier inversionChang-Yong Kim, Jeffrey W Elam, Michael J Pellin, et al.
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