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Michael R Keenan

Showing results (1-10 of 9) with videos related to

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Applied Spectroscopy|March 1, 2011
Angle-constrained alternating least squaresWillem Windig, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 23, 2010
Advantages of clustering in the phase classification of hyperspectral materials imagesChristopher L Stork, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Application of multivariate statistical analysis to STEM X-ray spectral images: interfacial analysis in microelectronicsPaul G Kotula, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D MicroanalysisPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis toolPaul G Kotula, Michael R Keenan, Joseph R Michael
Applied Spectroscopy|February 22, 2005
Multivariate analysis of infrared spectra for monitoring and understanding the kinetics and mechanisms of adsorption processesAnding Zhang, Wenxiang Zeng, Thomas M Niemczyk, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Journal of the American Society for Mass Spectrometry|June 25, 2026
Interlaboratory Comparison of Orbitrap Analyzers in OrbiSIMS: Noise Parameters, Intensity Scaling, and Detection LimitsGustavo F Trindade, Michael R Keenan, Alexander Pirkl, et al.
Nature Communications|July 10, 2025
Orbitrap noise structure and method for noise unbiased multivariate analysisMichael R Keenan, Gustavo F Trindade, Alexander Pirkl, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Spectroscopy|March 1, 2011
Angle-constrained alternating least squaresWillem Windig, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 23, 2010
Advantages of clustering in the phase classification of hyperspectral materials imagesChristopher L Stork, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Application of multivariate statistical analysis to STEM X-ray spectral images: interfacial analysis in microelectronicsPaul G Kotula, Michael R Keenan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D MicroanalysisPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis toolPaul G Kotula, Michael R Keenan, Joseph R Michael
Applied Spectroscopy|February 22, 2005
Multivariate analysis of infrared spectra for monitoring and understanding the kinetics and mechanisms of adsorption processesAnding Zhang, Wenxiang Zeng, Thomas M Niemczyk, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Journal of the American Society for Mass Spectrometry|June 25, 2026
Interlaboratory Comparison of Orbitrap Analyzers in OrbiSIMS: Noise Parameters, Intensity Scaling, and Detection LimitsGustavo F Trindade, Michael R Keenan, Alexander Pirkl, et al.
Nature Communications|July 10, 2025
Orbitrap noise structure and method for noise unbiased multivariate analysisMichael R Keenan, Gustavo F Trindade, Alexander Pirkl, et al.
Pageof 1