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Michael Stuckelberger

Showing results (1-10 of 8) with videos related to

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ACS Applied Materials & Interfaces|May 27, 2016
Nanohole Structuring for Improved Performance of Hydrogenated Amorphous Silicon PhotovoltaicsEric Johlin, Ahmed Al-Obeidi, Gizem Nogay, et al.
Journal of Visualized Experiments : Jove|March 20, 2018
Quantifying X-Ray Fluorescence Data Using MAPSTara Nietzold, Bradley M West, Michael Stuckelberger, et al.
Journal of Synchrotron Radiation|August 8, 2024
Correcting angular distortions in Bragg coherent X-ray diffraction imagingHuaiyu Chen, Dmitry Dzhigaev, Alexander Björling, et al.
Journal of Applied Crystallography|October 9, 2025
Ultimate sensitivity in X-ray diffraction: angular moments versus shot noisePeter Modregger, Felix Wittwer, Ahmar Khaliq, et al.
Journal of Synchrotron Radiation|December 24, 2016
X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case studyBradley M West, Michael Stuckelberger, April Jeffries, et al.
Nano Letters|August 8, 2014
Self-patterned nanoparticle layers for vertical interconnects: application in tandem solar cellsBjoern Niesen, Nicolas Blondiaux, Mathieu Boccard, et al.
The Journal of Physical Chemistry Letters|August 12, 2015
Complex Refractive Index Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and SpectrophotometryPhilipp Löper, Michael Stuckelberger, Bjoern Niesen, et al.
Small Methods|May 1, 2024
Benchmarking of X-Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of AtomsMateus G Masteghin, Toussaint Gervais, Steven K Clowes, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|May 27, 2016
Nanohole Structuring for Improved Performance of Hydrogenated Amorphous Silicon PhotovoltaicsEric Johlin, Ahmed Al-Obeidi, Gizem Nogay, et al.
Journal of Visualized Experiments : Jove|March 20, 2018
Quantifying X-Ray Fluorescence Data Using MAPSTara Nietzold, Bradley M West, Michael Stuckelberger, et al.
Journal of Synchrotron Radiation|August 8, 2024
Correcting angular distortions in Bragg coherent X-ray diffraction imagingHuaiyu Chen, Dmitry Dzhigaev, Alexander Björling, et al.
Journal of Applied Crystallography|October 9, 2025
Ultimate sensitivity in X-ray diffraction: angular moments versus shot noisePeter Modregger, Felix Wittwer, Ahmar Khaliq, et al.
Journal of Synchrotron Radiation|December 24, 2016
X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case studyBradley M West, Michael Stuckelberger, April Jeffries, et al.
Nano Letters|August 8, 2014
Self-patterned nanoparticle layers for vertical interconnects: application in tandem solar cellsBjoern Niesen, Nicolas Blondiaux, Mathieu Boccard, et al.
The Journal of Physical Chemistry Letters|August 12, 2015
Complex Refractive Index Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and SpectrophotometryPhilipp Löper, Michael Stuckelberger, Bjoern Niesen, et al.
Small Methods|May 1, 2024
Benchmarking of X-Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of AtomsMateus G Masteghin, Toussaint Gervais, Steven K Clowes, et al.
Pageof 1