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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 26, 2012
Disassembling glancing angle deposited films for high-throughput, single-post growth scaling measurementsJoshua Morgan Arthur Siewert, Joshua Michael LaForge, Michael Thomas Taschuk, et al.Pageof 1