Disassembling glancing angle deposited films for high-throughput, single-post growth scaling measurements

Joshua Morgan Arthur Siewert1, Joshua Michael LaForge, Michael Thomas Taschuk

  • 1Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 2V4, Canada. jsiewert@ualberta

Summary

This study introduces a new method for analyzing nanostructured thin films created by glancing angle deposition (GLAD). The technique helps understand nanocolumn broadening and growth scaling, revealing deviations from theoretical limits.

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