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Michal Odstrčil

Showing results (1-10 of 13) with videos related to

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Optics Express|February 7, 2018
Iterative least-squares solver for generalized maximum-likelihood ptychographyMichal Odstrčil, Andreas Menzel, Manuel Guizar-Sicairos
Optics Express|May 27, 2018
Arbitrary-path fly-scan ptychographyMichal Odstrčil, Mirko Holler, Manuel Guizar-Sicairos
Optics Express|December 25, 2019
Alignment methods for nanotomography with deep subpixel accuracyMichal Odstrčil, Mirko Holler, Jörg Raabe, et al.
Optics Express|June 6, 2019
Towards optimized illumination for high-resolution ptychographyMichal Odstrčil, Maxime Lebugle, Manuel Guizar-Sicairos, et al.
Optics Letters|June 16, 2015
Interferometric broadband Fourier spectroscopy with a partially coherent gas-discharge extreme ultraviolet light sourceDenis Rudolf, Jan Bußmann, Michal Odstrčil, et al.
Optics Letters|July 2, 2016
Wide-field broadband extreme ultraviolet transmission ptychography using a high-harmonic source: publisher's notePeter D Baksh, Michal Odstrčil, Hyun-Su Kim, et al.
Optics Letters|May 19, 2016
Wide-field broadband extreme ultraviolet transmission ptychography using a high-harmonic sourcePeter D Baksh, Michal Odstrčil, Hyun-Su Kim, et al.
Journal of Synchrotron Radiation|May 9, 2020
LamNI - an instrument for X-ray scanning microscopy in laminography geometryMirko Holler, Michal Odstrčil, Manuel Guizar-Sicairos, et al.
Ultramicroscopy|April 2, 2023
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychographyHaoyan Lu, Michal Odstrčil, Charles Pooley, et al.
Iscience|January 18, 2019
Correlated X-Ray 3D Ptychography and Diffraction Microscopy Visualize Links between Morphology and Crystal Structure of Lithium-Rich Cathode MaterialsEsther H R Tsai, Juliette Billaud, Dario F Sanchez, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Optics Express|February 7, 2018
Iterative least-squares solver for generalized maximum-likelihood ptychographyMichal Odstrčil, Andreas Menzel, Manuel Guizar-Sicairos
Optics Express|May 27, 2018
Arbitrary-path fly-scan ptychographyMichal Odstrčil, Mirko Holler, Manuel Guizar-Sicairos
Optics Express|December 25, 2019
Alignment methods for nanotomography with deep subpixel accuracyMichal Odstrčil, Mirko Holler, Jörg Raabe, et al.
Optics Express|June 6, 2019
Towards optimized illumination for high-resolution ptychographyMichal Odstrčil, Maxime Lebugle, Manuel Guizar-Sicairos, et al.
Optics Letters|June 16, 2015
Interferometric broadband Fourier spectroscopy with a partially coherent gas-discharge extreme ultraviolet light sourceDenis Rudolf, Jan Bußmann, Michal Odstrčil, et al.
Optics Letters|July 2, 2016
Wide-field broadband extreme ultraviolet transmission ptychography using a high-harmonic source: publisher's notePeter D Baksh, Michal Odstrčil, Hyun-Su Kim, et al.
Optics Letters|May 19, 2016
Wide-field broadband extreme ultraviolet transmission ptychography using a high-harmonic sourcePeter D Baksh, Michal Odstrčil, Hyun-Su Kim, et al.
Journal of Synchrotron Radiation|May 9, 2020
LamNI - an instrument for X-ray scanning microscopy in laminography geometryMirko Holler, Michal Odstrčil, Manuel Guizar-Sicairos, et al.
Ultramicroscopy|April 2, 2023
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychographyHaoyan Lu, Michal Odstrčil, Charles Pooley, et al.
Iscience|January 18, 2019
Correlated X-Ray 3D Ptychography and Diffraction Microscopy Visualize Links between Morphology and Crystal Structure of Lithium-Rich Cathode MaterialsEsther H R Tsai, Juliette Billaud, Dario F Sanchez, et al.
Pageof 2