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Michal Poksinski

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Optics Letters|April 19, 2007
Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfacesMichal Poksinski, Hans Arwin
Applied Optics|June 5, 2004
Total internal reflection ellipsometry: principles and applicationsHans Arwin, Michal Poksinski, Knut Johansen
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Optics Letters|April 19, 2007
Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfacesMichal Poksinski, Hans Arwin
Applied Optics|June 5, 2004
Total internal reflection ellipsometry: principles and applicationsHans Arwin, Michal Poksinski, Knut Johansen
Pageof 1