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Michel Despont

Showing results (1-10 of 13) with videos related to

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Nanotechnology|May 7, 2009
Encapsulated tips for reliable nanoscale conduction in scanning probe technologiesHarish Bhaskaran, Abu Sebastian, Ute Drechsler, et al.
The Review of Scientific Instruments|January 7, 2009
Cryogenic current-in-plane tunneling apparatusNicolas Weiss, Ute Drechsler, Michel Despont, et al.
The Review of Scientific Instruments|September 4, 2009
Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopyHarish Bhaskaran, Abu Sebastian, Andrew Pauza, et al.
Nanotechnology|May 24, 2011
Rapid turnaround scanning probe nanolithographyPhilip C Paul, Armin W Knoll, Felix Holzner, et al.
The Review of Scientific Instruments|December 3, 2008
Analyzing refractive index changes and differential bending in microcantilever arraysFrançois Huber, Hans Peter Lang, Martin Hegner, et al.
Optics Letters|December 24, 2025
On-chip reconfigurable polarization splitter-rotator fabricated on a thin-film lithium niobate photonic integrated circuit platformFlorian Dubois, Alberto Della Torre, Jacopo Leo, et al.
The Review of Scientific Instruments|October 2, 2012
Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopyAbu Sebastian, Naveen Shamsudhin, Hugo Rothuizen, et al.
Science (New York, N.Y.)|April 24, 2010
Nanoscale three-dimensional patterning of molecular resists by scanning probesDavid Pires, James L Hedrick, Anuja De Silva, et al.
Nature Nanotechnology|February 2, 2010
Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbonHarish Bhaskaran, Bernd Gotsmann, Abu Sebastian, et al.
Nano Letters|August 23, 2013
Thermal probe maskless lithography for 27.5 nm half-pitch Si technologyLin Lee Cheong, Philip Paul, Felix Holzner, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Nanotechnology|May 7, 2009
Encapsulated tips for reliable nanoscale conduction in scanning probe technologiesHarish Bhaskaran, Abu Sebastian, Ute Drechsler, et al.
The Review of Scientific Instruments|January 7, 2009
Cryogenic current-in-plane tunneling apparatusNicolas Weiss, Ute Drechsler, Michel Despont, et al.
The Review of Scientific Instruments|September 4, 2009
Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopyHarish Bhaskaran, Abu Sebastian, Andrew Pauza, et al.
Nanotechnology|May 24, 2011
Rapid turnaround scanning probe nanolithographyPhilip C Paul, Armin W Knoll, Felix Holzner, et al.
The Review of Scientific Instruments|December 3, 2008
Analyzing refractive index changes and differential bending in microcantilever arraysFrançois Huber, Hans Peter Lang, Martin Hegner, et al.
Optics Letters|December 24, 2025
On-chip reconfigurable polarization splitter-rotator fabricated on a thin-film lithium niobate photonic integrated circuit platformFlorian Dubois, Alberto Della Torre, Jacopo Leo, et al.
The Review of Scientific Instruments|October 2, 2012
Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopyAbu Sebastian, Naveen Shamsudhin, Hugo Rothuizen, et al.
Science (New York, N.Y.)|April 24, 2010
Nanoscale three-dimensional patterning of molecular resists by scanning probesDavid Pires, James L Hedrick, Anuja De Silva, et al.
Nature Nanotechnology|February 2, 2010
Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbonHarish Bhaskaran, Bernd Gotsmann, Abu Sebastian, et al.
Nano Letters|August 23, 2013
Thermal probe maskless lithography for 27.5 nm half-pitch Si technologyLin Lee Cheong, Philip Paul, Felix Holzner, et al.
Pageof 2