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Mike B Matthews

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 18, 2021
Low-Voltage Electron-Probe Microanalysis of UraniumMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2019
Electron Probe Microanalysis Through Coated Oxidized SurfacesMike B Matthews, Ben Buse, Stuart L Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 17, 2018
Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2018
The Accuracy of Al and Cu Film Thickness Determinations and the Implications for Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Pageof 1

Showing results (1-10 of 4) with videos related to

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Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 18, 2021
Low-Voltage Electron-Probe Microanalysis of UraniumMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2019
Electron Probe Microanalysis Through Coated Oxidized SurfacesMike B Matthews, Ben Buse, Stuart L Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 17, 2018
Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2018
The Accuracy of Al and Cu Film Thickness Determinations and the Implications for Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Pageof 1