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Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|February 15, 2008
Porous low dielectric constant materials for microelectronicsMikhail R Baklanov, Karen MaexLangmuir : the ACS Journal of Surfaces and Colloids|November 23, 2007
Characterization of a molecular sieve coating using ellipsometric porosimetrySalvador Eslava, Mikhail R Baklanov, Christine E A Kirschhock, et al.Langmuir : the ACS Journal of Surfaces and Colloids|April 9, 2008
Reaction of trimethylchlorosilane in spin-on Silicalite-1 zeolite filmSalvador Eslava, Stephane Delahaye, Mikhail R Baklanov, et al.Journal of the American Chemical Society|December 5, 2008
Zeolite-inspired low-k dielectrics overcoming limitations of zeolite filmsSalvador Eslava, Jone Urrutia, Abheesh N Busawon, et al.Nanotechnology|July 29, 2009
Patterning of metallic nanoparticles for the growth of carbon nanotubesSantiago Esconjauregui, Caroline M Whelan, Karen MaexMaterials (Basel, Switzerland)|April 30, 2021
Analytical Study of Porous Organosilicate Glass Films Prepared from Mixtures of 1,3,5- and 1,3-AlkoxysilylbenzenesMd Rasadujjaman, Xuesong Wang, Yanrong Wang, et al.Langmuir : the ACS Journal of Surfaces and Colloids|September 17, 2013
Effect of pore structure of nanometer scale porous films on the measured elastic modulusKris Vanstreels, Chen Wu, Mario Gonzalez, et al.Nature Communications|January 27, 2011
Pseudogap in a thin film of a conventional superconductorBenjamin Sacépé, Claude Chapelier, Tatyana I Baturina, et al.Scientific Reports|May 13, 2017
Reentrant Resistive Behavior and Dimensional Crossover in Disordered Superconducting TiN FilmsSvetlana V Postolova, Alexey Yu Mironov, Mikhail R Baklanov, et al.Data in Brief|March 15, 2021
Effect of methyl terminal and ethylene bridging groups on porous organosilicate glass films: FTIR, ellipsometric porosimetry, luminescence datasetMd Rasadujjaman, Jinming Zhang, Konstantin P Mogilnikov, et al.Pageof 3