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Mil'shtein

Showing results (1-10 of 7) with videos related to

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Scanning|August 25, 2000
Semiconductor devices "from inside"Mil'shtein
Scanning|October 27, 2006
Infrared scanning for biomedical applicationsS Mil'Shtein
Scanning|June 21, 2002
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivityS Mil'shtein
Scanning|December 23, 2004
Scanning the pressure-induced distortion of fingerprintsS Mil'shtein, U Doshi
Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Scanning|December 22, 2006
Contactless optical scanning of fingerprints with 180 degrees viewJ Palma, C Liessner, S Mil'shtein
Nanoscale Research Letters|November 15, 2012
3D modeling of dual-gate FinFETSamson Mil'shtein, Lalitha Devarakonda, Brian Zanchi, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Scanning|August 25, 2000
Semiconductor devices "from inside"Mil'shtein
Scanning|October 27, 2006
Infrared scanning for biomedical applicationsS Mil'Shtein
Scanning|June 21, 2002
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivityS Mil'shtein
Scanning|December 23, 2004
Scanning the pressure-induced distortion of fingerprintsS Mil'shtein, U Doshi
Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Scanning|December 22, 2006
Contactless optical scanning of fingerprints with 180 degrees viewJ Palma, C Liessner, S Mil'shtein
Nanoscale Research Letters|November 15, 2012
3D modeling of dual-gate FinFETSamson Mil'shtein, Lalitha Devarakonda, Brian Zanchi, et al.
Pageof 1