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Mohammad S M Saifullah

Showing results (11-20 of 21) with videos related to

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ACS Applied Materials & Interfaces|July 8, 2020
Thermoelectric Properties of Substoichiometric Electron Beam Patterned Bismuth SulfideJose Recatala-Gomez, Hong Kuan Ng, Pawan Kumar, et al.
ACS Applied Materials & Interfaces|November 8, 2019
Ultrasmall Designed Plasmon Resonators by Fused Colloidal NanopatterningMohamed Asbahi, Zackaria Mahfoud, Surani B Dolmanan, et al.
ACS Nano|June 5, 2015
Fabrication of Self-Cleaning, Reusable Titania Templates for Nanometer and Micrometer Scale Protein PatterningMark Moxey, Alexander Johnson, Osama El-Zubir, et al.
ACS Nano|August 20, 2024
Approaching Angstrom-Scale Resolution in Lithography Using Low-Molecular-Mass Resists (<500 Da)Mohammad S M Saifullah, Anil Kumar Rajak, Kevin A Hofhuis, et al.
ACS Nano|January 31, 2015
Multiscale ommatidial arrays with broadband and omnidirectional antireflection and antifogging properties by sacrificial layer mediated nanoimprintingHemant Kumar Raut, Saman Safari Dinachali, Yee Chong Loke, et al.
Science Advances|February 13, 2019
Boosting contact sliding and wear protection via atomic intermixing and tailoring of nanoscale interfacesNeeraj Dwivedi, Reuben J Yeo, Chetna Dhand, et al.
ACS Nano|September 23, 2017
Direct Patterning of Zinc Sulfide on a Sub-10 Nanometer Scale via Electron Beam LithographyMohammad S M Saifullah, Mohamed Asbahi, Maryam Binti-Kamran Kiyani, et al.
Nano Letters|October 29, 2021
Angstrom-Scale Transparent Overcoats: Interfacial Nitrogen-Driven Atomic Intermingling Promotes Lubricity and Surface Protection of Ultrathin CarbonNeeraj Dwivedi, Arnab Neogi, Tarak K Patra, et al.
Nano Letters|September 7, 2022
Patterning at the Resolution Limit of Commercial Electron Beam LithographyMohammad S M Saifullah, Mohamed Asbahi, Darren C J Neo, et al.
ACS Applied Materials & Interfaces|March 17, 2020
Room-Temperature Patterning of Nanoscale MoS<sub>2</sub> under an Electron BeamMohammad S M Saifullah, Mohamed Asbahi, Maryam Binti-Kamran Kiyani, et al.
Pageof 3

Showing results (11-20 of 21) with videos related to

Sort By:
Pageof 3
ACS Applied Materials & Interfaces|July 8, 2020
Thermoelectric Properties of Substoichiometric Electron Beam Patterned Bismuth SulfideJose Recatala-Gomez, Hong Kuan Ng, Pawan Kumar, et al.
ACS Applied Materials & Interfaces|November 8, 2019
Ultrasmall Designed Plasmon Resonators by Fused Colloidal NanopatterningMohamed Asbahi, Zackaria Mahfoud, Surani B Dolmanan, et al.
ACS Nano|June 5, 2015
Fabrication of Self-Cleaning, Reusable Titania Templates for Nanometer and Micrometer Scale Protein PatterningMark Moxey, Alexander Johnson, Osama El-Zubir, et al.
ACS Nano|August 20, 2024
Approaching Angstrom-Scale Resolution in Lithography Using Low-Molecular-Mass Resists (<500 Da)Mohammad S M Saifullah, Anil Kumar Rajak, Kevin A Hofhuis, et al.
ACS Nano|January 31, 2015
Multiscale ommatidial arrays with broadband and omnidirectional antireflection and antifogging properties by sacrificial layer mediated nanoimprintingHemant Kumar Raut, Saman Safari Dinachali, Yee Chong Loke, et al.
Science Advances|February 13, 2019
Boosting contact sliding and wear protection via atomic intermixing and tailoring of nanoscale interfacesNeeraj Dwivedi, Reuben J Yeo, Chetna Dhand, et al.
ACS Nano|September 23, 2017
Direct Patterning of Zinc Sulfide on a Sub-10 Nanometer Scale via Electron Beam LithographyMohammad S M Saifullah, Mohamed Asbahi, Maryam Binti-Kamran Kiyani, et al.
Nano Letters|October 29, 2021
Angstrom-Scale Transparent Overcoats: Interfacial Nitrogen-Driven Atomic Intermingling Promotes Lubricity and Surface Protection of Ultrathin CarbonNeeraj Dwivedi, Arnab Neogi, Tarak K Patra, et al.
Nano Letters|September 7, 2022
Patterning at the Resolution Limit of Commercial Electron Beam LithographyMohammad S M Saifullah, Mohamed Asbahi, Darren C J Neo, et al.
ACS Applied Materials & Interfaces|March 17, 2020
Room-Temperature Patterning of Nanoscale MoS<sub>2</sub> under an Electron BeamMohammad S M Saifullah, Mohamed Asbahi, Maryam Binti-Kamran Kiyani, et al.
Pageof 3