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Mohammed H Modi

Showing results (11-20 of 15) with videos related to

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Optics Express|July 10, 2012
NbC/Si multilayer mirror for next generation EUV light sourcesMohammed H Modi, S K Rai, Mourad Idir, et al.
Applied Optics|February 23, 2023
Boron carbide thin film surface characterization after graphitic carbon removal using low-pressure oxygen gas RF plasmaPraveen K Yadav, Raj Kumar Gupta, Shruti Gupta, et al.
Journal of Synchrotron Radiation|July 5, 2022
Study of interface reaction in a B<sub>4</sub>C/Cr mirror at elevated temperature using soft X-ray reflectivityMohammed H Modi, Shruti Gupta, Praveen K Yadav, et al.
The Review of Scientific Instruments|February 16, 2024
A versatile beamline for soft x-ray reflectivity, absorption, and fluorescence measurements at Indus-2 synchrotron sourceMohammed H Modi, Rajkumar Gupta, Shruti Gupta, et al.
Applied Optics|October 24, 2012
Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivityArijeet Das, Rajkumar K Gupta, Mohammed H Modi, et al.
Pageof 2

Showing results (11-20 of 15) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 15 results.
Optics Express|July 10, 2012
NbC/Si multilayer mirror for next generation EUV light sourcesMohammed H Modi, S K Rai, Mourad Idir, et al.
Applied Optics|February 23, 2023
Boron carbide thin film surface characterization after graphitic carbon removal using low-pressure oxygen gas RF plasmaPraveen K Yadav, Raj Kumar Gupta, Shruti Gupta, et al.
Journal of Synchrotron Radiation|July 5, 2022
Study of interface reaction in a B<sub>4</sub>C/Cr mirror at elevated temperature using soft X-ray reflectivityMohammed H Modi, Shruti Gupta, Praveen K Yadav, et al.
The Review of Scientific Instruments|February 16, 2024
A versatile beamline for soft x-ray reflectivity, absorption, and fluorescence measurements at Indus-2 synchrotron sourceMohammed H Modi, Rajkumar Gupta, Shruti Gupta, et al.
Applied Optics|October 24, 2012
Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivityArijeet Das, Rajkumar K Gupta, Mohammed H Modi, et al.
Pageof 2