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ACS Applied Materials & Interfaces
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April 16, 2021
Restricted Channel Migration in 2D Multilayer ReS<sub>2</sub>
Chulmin Kim, Moonsoo Sung, Soo Yeon Kim, et al.
Nanotechnology
|
December 10, 2020
Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET
Kookjin Lee, Yeonsu Kim, Hyebin Lee, et al.
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Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
ACS Applied Materials & Interfaces
|
April 16, 2021
Restricted Channel Migration in 2D Multilayer ReS<sub>2</sub>
Chulmin Kim, Moonsoo Sung, Soo Yeon Kim, et al.
Nanotechnology
|
December 10, 2020
Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET
Kookjin Lee, Yeonsu Kim, Hyebin Lee, et al.
Page
of 1