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Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
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August 22, 2002
Artificial neural networks for automation of Rutherford backscattering spectroscopy experiments and data analysis
N P Barradas, A Vieira, R Patrício
Analytical Chemistry
|
June 12, 2012
Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry
C Jeynes, N P Barradas, E Szilágyi
Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
|
April 24, 2002
Bayesian inference analysis of ellipsometry data
N P Barradas, J L Keddie, R Sackin
Journal of Nanoscience and Nanotechnology
|
May 16, 2009
Intrinsic p type ZnO films deposited by rf magnetron sputtering
Jinzhong Wang, Rodrigo Martins, N P Barradas, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|
June 6, 2003
Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
V Matias, G Ohl, J C Soares, et al.
Journal of Nanoscience and Nanotechnology
|
April 2, 2010
Electrical and Raman scattering studies of ZnO:P and ZnO:Sb thin films
J Ayres de Campos, T Viseu, A G Rolo, et al.
Journal of Nanoscience and Nanotechnology
|
April 1, 2010
N-doped photocatalytic titania thin films on active polymer substrates
C J Tavares, S M Marques, S Lanceros-Méndez, et al.
Nanotechnology
|
September 22, 2012
Influence of annealing conditions on the formation of regular lattices of voids and Ge quantum dots in an amorphous alumina matrix
S R C Pinto, M Buljan, L Marques, et al.
Nanotechnology
|
November 25, 2010
Mn-doped ZnO nanocrystals embedded in Al2O3: structural and electrical properties
A Khodorov, S Levichev, A G Rolo, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 9) with videos related to
Sort By:
Page
of 1
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|
August 22, 2002
Artificial neural networks for automation of Rutherford backscattering spectroscopy experiments and data analysis
N P Barradas, A Vieira, R Patrício
Analytical Chemistry
|
June 12, 2012
Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry
C Jeynes, N P Barradas, E Szilágyi
Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
|
April 24, 2002
Bayesian inference analysis of ellipsometry data
N P Barradas, J L Keddie, R Sackin
Journal of Nanoscience and Nanotechnology
|
May 16, 2009
Intrinsic p type ZnO films deposited by rf magnetron sputtering
Jinzhong Wang, Rodrigo Martins, N P Barradas, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|
June 6, 2003
Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
V Matias, G Ohl, J C Soares, et al.
Journal of Nanoscience and Nanotechnology
|
April 2, 2010
Electrical and Raman scattering studies of ZnO:P and ZnO:Sb thin films
J Ayres de Campos, T Viseu, A G Rolo, et al.
Journal of Nanoscience and Nanotechnology
|
April 1, 2010
N-doped photocatalytic titania thin films on active polymer substrates
C J Tavares, S M Marques, S Lanceros-Méndez, et al.
Nanotechnology
|
September 22, 2012
Influence of annealing conditions on the formation of regular lattices of voids and Ge quantum dots in an amorphous alumina matrix
S R C Pinto, M Buljan, L Marques, et al.
Nanotechnology
|
November 25, 2010
Mn-doped ZnO nanocrystals embedded in Al2O3: structural and electrical properties
A Khodorov, S Levichev, A G Rolo, et al.
Page
of 1