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Applied Optics|November 22, 2021
Correction of PZT scanner errors using a phase compensation method in white-light phase-shifting interferometryNamyoon Kim, Soonyang KwonOptics Express|August 5, 2014
Critical dimension measurement of transparent film layers by multispectral imagingSoonyang Kwon, Namyoon Kim, Taeyong Jo, et al.Nanophotonics (Berlin, Germany)|December 5, 2024
Edge roughness analysis in nanoscale for single-molecule localization microscopy imagesUidon Jeong, Ga-Eun Go, Dokyung Jeong, et al.Pageof 1