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Nanotechnology|January 19, 2010
Structure and defect characterization of multiferroic ReMnO(3) films and multilayers by TEMNeerushana Jehanathan, Oleg Lebedev, Isabelle Gélard, et al.
Micron (Oxford, England : 1993)|October 10, 2018
Hole free phase plate tomography for materials sciences samplesMisa Hayashida, Kai Cui, Amin Morteza Najarian, et al.
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