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Science Advances|August 8, 2017
Nondestructive imaging of atomically thin nanostructures buried in siliconGeorg Gramse, Alexander Kölker, Tingbin Lim, et al.The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|August 30, 2023
Adsorption and Thermal Decomposition of Triphenyl Bismuth on Silicon (001)Eric A S Lundgren, Carly Byron, Procopios Constantinou, et al.Science Advances|April 19, 2023
Resistless EUV lithography: Photon-induced oxide patterning on siliconLi-Ting Tseng, Prajith Karadan, Dimitrios Kazazis, et al.Nature Communications|January 24, 2024
EUV-induced hydrogen desorption as a step towards large-scale silicon quantum device patterningProcopios Constantinou, Taylor J Z Stock, Li-Ting Tseng, et al.ACS Nano|March 7, 2020
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling MicroscopyTaylor J Z Stock, Oliver Warschkow, Procopios C Constantinou, et al.The Journal of Physical Chemistry. B|February 24, 2006
Phosphine dissociation and diffusion on Si(001) observed at the atomic scaleSteven R Schofield, Neil J Curson, Oliver Warschkow, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|July 20, 2023
Momentum-Space Imaging of Ultra-Thin Electron Liquids in δ-Doped SiliconProcopios Constantinou, Taylor J Z Stock, Eleanor Crane, et al.Small Methods|May 1, 2024
Benchmarking of X-Ray Fluorescence Microscopy with Ion Beam Implanted Samples Showing Detection Sensitivity of Hundreds of AtomsMateus G Masteghin, Toussaint Gervais, Steven K Clowes, et al.Pageof 2