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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2000
Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron MicroscopePennycook, Rafferty, Nellist
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2013
Identifying and correcting scan noise and drift in the scanning transmission electron microscopeLewys Jones, Peter D Nellist
Physical Review Letters|October 4, 2000
Shallow implantation of "Size-Selected" Ag clusters into graphiteCarroll, Nellist, Palmer, et al.
Micron (Oxford, England : 1993)|January 29, 2014
Testing the accuracy of the two-dimensional object model in HAADF STEMLewys Jones, Peter D Nellist
Ultramicroscopy|February 20, 2007
A Bloch wave analysis of optical sectioning in aberration-corrected STEME C Cosgriff, P D Nellist
Acta Crystallographica. Section E, Structure Reports Online|June 1, 2013
6-Chloro-2-(thio-phen-2-yl)-1-[(thio-phen-2-yl)meth-yl]-1H-benzimidazoleDavid K Geiger, Michael R Nellist
Acta Crystallographica. Section E, Structure Reports Online|October 8, 2013
5-Chloro-2-(thio-phen-2-yl)-1-(thio-phen-2-ylmeth-yl)-1H-benzimidazole-6-chloro-2-(thiophen-2-yl)-1-(thiophen-2-ylmethyl)-1H-benzimidazole (0.94/0.06)David K Geiger, Michael R Nellist
Journal of Electron Microscopy|August 31, 2004
HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysisYiping Peng, Peter D Nellist, Stephen J Pennycook
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