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Nicola Viganò

Showing results (1-10 of 6) with videos related to

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Scientific Reports|February 13, 2016
Three-dimensional full-field X-ray orientation microscopyNicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Optics Express|May 5, 2019
Advanced light-field refocusing through tomographic modeling of the photographed sceneNicola Viganò, Pablo Martínez Gil, Charlotte Herzog, et al.
Optics Letters|December 1, 2023
Synchrotron-based x ray fluorescence ghost imagingMathieu Manni, Adi Ben-Yehuda, Yishai Klein, et al.
Optics Express|September 7, 2018
Tomographic approach for the quantitative scene reconstruction from light field imagesNicola Viganò, Henri Der Sarkissian, Charlotte Herzog, et al.
Journal of Imaging|August 30, 2021
Emulation of X-ray Light-Field CamerasNicola Viganò, Felix Lucka, Ombeline de La Rochefoucauld, et al.
Ultramicroscopy|September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomographyPatrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Scientific Reports|February 13, 2016
Three-dimensional full-field X-ray orientation microscopyNicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Optics Express|May 5, 2019
Advanced light-field refocusing through tomographic modeling of the photographed sceneNicola Viganò, Pablo Martínez Gil, Charlotte Herzog, et al.
Optics Letters|December 1, 2023
Synchrotron-based x ray fluorescence ghost imagingMathieu Manni, Adi Ben-Yehuda, Yishai Klein, et al.
Optics Express|September 7, 2018
Tomographic approach for the quantitative scene reconstruction from light field imagesNicola Viganò, Henri Der Sarkissian, Charlotte Herzog, et al.
Journal of Imaging|August 30, 2021
Emulation of X-ray Light-Field CamerasNicola Viganò, Felix Lucka, Ombeline de La Rochefoucauld, et al.
Ultramicroscopy|September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomographyPatrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Pageof 1