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Scientific Reports
|
February 13, 2016
Three-dimensional full-field X-ray orientation microscopy
Nicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Optics Express
|
May 5, 2019
Advanced light-field refocusing through tomographic modeling of the photographed scene
Nicola Viganò, Pablo Martínez Gil, Charlotte Herzog, et al.
Optics Letters
|
December 1, 2023
Synchrotron-based x ray fluorescence ghost imaging
Mathieu Manni, Adi Ben-Yehuda, Yishai Klein, et al.
Optics Express
|
September 7, 2018
Tomographic approach for the quantitative scene reconstruction from light field images
Nicola Viganò, Henri Der Sarkissian, Charlotte Herzog, et al.
Journal of Imaging
|
August 30, 2021
Emulation of X-ray Light-Field Cameras
Nicola Viganò, Felix Lucka, Ombeline de La Rochefoucauld, et al.
Ultramicroscopy
|
September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography
Patrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Scientific Reports
|
February 13, 2016
Three-dimensional full-field X-ray orientation microscopy
Nicola Viganò, Alexandre Tanguy, Simon Hallais, et al.
Optics Express
|
May 5, 2019
Advanced light-field refocusing through tomographic modeling of the photographed scene
Nicola Viganò, Pablo Martínez Gil, Charlotte Herzog, et al.
Optics Letters
|
December 1, 2023
Synchrotron-based x ray fluorescence ghost imaging
Mathieu Manni, Adi Ben-Yehuda, Yishai Klein, et al.
Optics Express
|
September 7, 2018
Tomographic approach for the quantitative scene reconstruction from light field images
Nicola Viganò, Henri Der Sarkissian, Charlotte Herzog, et al.
Journal of Imaging
|
August 30, 2021
Emulation of X-ray Light-Field Cameras
Nicola Viganò, Felix Lucka, Ombeline de La Rochefoucauld, et al.
Ultramicroscopy
|
September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography
Patrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Page
of 1