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    X-ray fluorescence ghost imaging (XRF-GI) is now feasible at synchrotrons, offering reduced dose and acquisition times. This technique enhances imaging capabilities for challenging samples like liquids and improves stability.

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    Area of Science:

    • Physics
    • Materials Science
    • Imaging Technology

    Background:

    • X-ray fluorescence ghost imaging (XRF-GI) has shown promise for laboratory X-ray sources.
    • XRF-GI offers potential benefits such as reduced acquisition time, lower deposited dose, and relaxed focusing constraints.
    • Extending XRF-GI to synchrotron sources could significantly advance X-ray imaging capabilities.

    Purpose of the Study:

    • To demonstrate the feasibility and implementation of synchrotron-based X-ray fluorescence ghost imaging (XRF-GI).
    • To adapt experimental setups and computational techniques for synchrotron XRF-GI.
    • To explore the advantages of synchrotron XRF-GI for advanced imaging applications.

    Main Methods:

    • Development of an adapted experimental setup for synchrotron XRF-GI.
    • Implementation of a corresponding computational technique for data processing.
    • Utilizing synchrotron X-ray sources for ghost imaging principles.

    Main Results:

    • Successful demonstration of synchrotron-based XRF-GI.
    • Validation of the adapted experimental and computational methods.
    • Extension of XRF-GI advantages to high-intensity synchrotron radiation.

    Conclusions:

    • Synchrotron-based XRF-GI is achievable, extending ghost imaging benefits to synchrotron XRF applications.
    • The developed methods enable improved trade-offs between acquisition time, dose, and spatial resolution.
    • This advancement opens possibilities for studying challenging samples, including liquids, and enhances resilience against experimental drifts.