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Nicolas Brodusch

Showing results (1-10 of 37) with videos related to

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Journal of Microscopy|April 20, 2017
The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission modeNicolas Brodusch, Raynald Gauvin
Ultramicroscopy|April 25, 2022
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)Nicolas Brodusch, Raynald Gauvin
Microscopy Research and Technique|October 4, 2014
Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam millingNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy (Oxford, England)|November 20, 2012
Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloysNicolas Brodusch, Sophie Boisvert, Raynald Gauvin
Ultramicroscopy|November 19, 2019
Improvement of the energy resolution of energy dispersive spectrometers (EDS) using Richardson-Lucy deconvolutionNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Journal of Microscopy|June 2, 2017
About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltageNicolas Brodusch, Frédéric Voisard, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Scanning|October 21, 2020
Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction TechniquesSeyed Mahmoud Bayazid, Nicolas Brodusch, Raynald Gauvin
Ultramicroscopy|November 17, 2023
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materialsAli Jaberi, Nicolas Brodusch, Jun Song, et al.
Pageof 4

Showing results (1-10 of 37) with videos related to

Sort By:
Pageof 4
Journal of Microscopy|April 20, 2017
The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission modeNicolas Brodusch, Raynald Gauvin
Ultramicroscopy|April 25, 2022
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)Nicolas Brodusch, Raynald Gauvin
Microscopy Research and Technique|October 4, 2014
Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam millingNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Microscopy (Oxford, England)|November 20, 2012
Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloysNicolas Brodusch, Sophie Boisvert, Raynald Gauvin
Ultramicroscopy|November 19, 2019
Improvement of the energy resolution of energy dispersive spectrometers (EDS) using Richardson-Lucy deconvolutionNicolas Brodusch, Karim Zaghib, Raynald Gauvin
Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Journal of Microscopy|June 2, 2017
About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltageNicolas Brodusch, Frédéric Voisard, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Scanning|October 21, 2020
Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction TechniquesSeyed Mahmoud Bayazid, Nicolas Brodusch, Raynald Gauvin
Ultramicroscopy|November 17, 2023
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materialsAli Jaberi, Nicolas Brodusch, Jun Song, et al.
Pageof 4