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Nicolas Brodusch

Showing results (11-20 of 37) with videos related to

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Journal of Microscopy|August 6, 2025
Comparison of two Monte Carlo approaches for homogeneous bulk samplesDawei Gao, Yu Yuan, Nicolas Brodusch, et al.
Ultramicroscopy|September 23, 2022
Line-rotated remapping for high-resolution electron backscatter diffractionYongzhe Wang, Nicolas Brodusch, Raynald Gauvin, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Ultramicroscopy|April 28, 2024
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)Nicolas Dumaresq, Nicolas Brodusch, Stéphanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2023
ZAFG Method for Quantitative Characterization of Spherical Particles: Deriving a Universal Equation for Geometrical CorrectionSeyed Mahmoud Bayazid, Nicolas Brodusch, Nicolas Dumaresq, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2015
Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation MappingDina Goldbaum, Richard R Chromik, Nicolas Brodusch, et al.
Ultramicroscopy|April 29, 2014
Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffractionMatthew Gallaugher, Nicolas Brodusch, Raynald Gauvin, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Pageof 4

Showing results (11-20 of 37) with videos related to

Sort By:
Pageof 4
Journal of Microscopy|August 6, 2025
Comparison of two Monte Carlo approaches for homogeneous bulk samplesDawei Gao, Yu Yuan, Nicolas Brodusch, et al.
Ultramicroscopy|September 23, 2022
Line-rotated remapping for high-resolution electron backscatter diffractionYongzhe Wang, Nicolas Brodusch, Raynald Gauvin, et al.
Scanning|February 27, 2013
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterizationNicolas Brodusch, Hendrix Demers, Michel Trudeau, et al.
Microscopy Research and Technique|January 7, 2014
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth oreNicolas Brodusch, Kristian Waters, Hendrix Demers, et al.
Ultramicroscopy|April 28, 2024
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)Nicolas Dumaresq, Nicolas Brodusch, Stéphanie Bessette, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 5, 2018
Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral CharacterizationChaoyi Teng, Hendrix Demers, Nicolas Brodusch, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2023
ZAFG Method for Quantitative Characterization of Spherical Particles: Deriving a Universal Equation for Geometrical CorrectionSeyed Mahmoud Bayazid, Nicolas Brodusch, Nicolas Dumaresq, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2015
Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation MappingDina Goldbaum, Richard R Chromik, Nicolas Brodusch, et al.
Ultramicroscopy|April 29, 2014
Magnetic domain structure and crystallographic orientation of electrical steels revealed by a forescatter detector and electron backscatter diffractionMatthew Gallaugher, Nicolas Brodusch, Raynald Gauvin, et al.
Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Pageof 4