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Beilstein Journal of Nanotechnology|July 15, 2015
Scanning reflection ion microscopy in a helium ion microscopeYuri V Petrov, Oleg F VyvenkoACS Omega|August 29, 2019
Copper-Stabilized Si/Au Nanowhiskers for Advanced Nanoelectronic ApplicationsKsenia Yu Maksimova, Anatoly A Kozlov, Petr V Shvets, et al.Pageof 1