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Olivier De Castro

Showing results (1-10 of 13) with videos related to

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Annual Review of Analytical Chemistry (Palo Alto, Calif.)|January 31, 2019
Imaging and Analytics on the Helium Ion MicroscopeTom Wirtz, Olivier De Castro, Jean-Nicolas Audinot, et al.
Reports on Progress in Physics. Physical Society (Great Britain)|August 17, 2021
Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscopeJean-Nicolas Audinot, Patrick Philipp, Olivier De Castro, et al.
Beilstein Journal of Nanotechnology|December 28, 2020
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detectorEduardo Serralta, Nico Klingner, Olivier De Castro, et al.
Beilstein Journal of Nanotechnology|August 31, 2019
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He<sup>+</sup>: Projected images and intensity patternsMichael Mousley, Santhana Eswara, Olivier De Castro, et al.
RSC Advances|May 2, 2022
Molecular flattening effect to enhance the conductivity of fused porphyrin tape thin filmsGiuseppe Bengasi, Jessica S Desport, Kamal Baba, et al.
ACS Applied Materials & Interfaces|July 22, 2020
Fused Metalloporphyrin Thin Film with Tunable Porosity via Chemical Vapor DepositionKamal Baba, Giuseppe Bengasi, François Loyer, et al.
Analytical Chemistry|September 7, 2022
Correlative High-Resolution Imaging of Iron Uptake in Lung MacrophagesJelena Lovrić, Neda Najafinobar, Michael E Kurczy, et al.
Ultramicroscopy|December 16, 2021
Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defectsSaba Tabean, Michael Mousley, Christoph Pauly, et al.
Analytical Chemistry|June 22, 2023
Toward <i>Operando</i> Structural, Chemical, and Electrochemical Analyses of Solid-State Batteries Using Correlative Secondary Ion Mass Spectrometry ImagingLuca Cressa, Yanyan Sun, Dustin Andersen, et al.
Analytical Chemistry|July 21, 2022
Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical ImagingOlivier De Castro, Jean-Nicolas Audinot, Hung Quang Hoang, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|January 31, 2019
Imaging and Analytics on the Helium Ion MicroscopeTom Wirtz, Olivier De Castro, Jean-Nicolas Audinot, et al.
Reports on Progress in Physics. Physical Society (Great Britain)|August 17, 2021
Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscopeJean-Nicolas Audinot, Patrick Philipp, Olivier De Castro, et al.
Beilstein Journal of Nanotechnology|December 28, 2020
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detectorEduardo Serralta, Nico Klingner, Olivier De Castro, et al.
Beilstein Journal of Nanotechnology|August 31, 2019
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He<sup>+</sup>: Projected images and intensity patternsMichael Mousley, Santhana Eswara, Olivier De Castro, et al.
RSC Advances|May 2, 2022
Molecular flattening effect to enhance the conductivity of fused porphyrin tape thin filmsGiuseppe Bengasi, Jessica S Desport, Kamal Baba, et al.
ACS Applied Materials & Interfaces|July 22, 2020
Fused Metalloporphyrin Thin Film with Tunable Porosity via Chemical Vapor DepositionKamal Baba, Giuseppe Bengasi, François Loyer, et al.
Analytical Chemistry|September 7, 2022
Correlative High-Resolution Imaging of Iron Uptake in Lung MacrophagesJelena Lovrić, Neda Najafinobar, Michael E Kurczy, et al.
Ultramicroscopy|December 16, 2021
Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defectsSaba Tabean, Michael Mousley, Christoph Pauly, et al.
Analytical Chemistry|June 22, 2023
Toward <i>Operando</i> Structural, Chemical, and Electrochemical Analyses of Solid-State Batteries Using Correlative Secondary Ion Mass Spectrometry ImagingLuca Cressa, Yanyan Sun, Dustin Andersen, et al.
Analytical Chemistry|July 21, 2022
Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical ImagingOlivier De Castro, Jean-Nicolas Audinot, Hung Quang Hoang, et al.
Pageof 2