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P Kruit

Showing results (11-20 of 22) with videos related to

Pageof 3
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Scanning|June 7, 2005
Resolution limit for EBID on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Scanning|March 1, 2006
Aberration model of a multibeam scanning microscope for electron beam-induced depositionM J van Bruggen, B van Someren, P Kruit
Scanning|June 7, 2005
Design approach for a multi-beam electron beam-induced deposition systemB van Someren, M J van Bruggen, P Kruit
Ultramicroscopy|October 24, 2017
Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopyI G C Weppelman, R J Moerland, J P Hoogenboom, et al.
Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Ultramicroscopy|December 21, 2002
Low-energy foil aberration correctorR H van Aken, C W Hagen, J E Barth, et al.
Ultramicroscopy|April 12, 2023
In multi electron beam systems, "Neighbours Matter"A Mohammadi-Gheidari, E R Kieft, X Guo, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Ultramicroscopy|August 24, 2010
Design of an aberration corrected low-voltage SEMR H van Aken, D J Maas, C W Hagen, et al.
Structural Dynamics (Melville, N.Y.)|May 9, 2019
Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blankerI G C Weppelman, R J Moerland, L Zhang, et al.
Pageof 3

Showing results (11-20 of 22) with videos related to

Sort By:
Pageof 3
Scanning|June 7, 2005
Resolution limit for EBID on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Scanning|March 1, 2006
Aberration model of a multibeam scanning microscope for electron beam-induced depositionM J van Bruggen, B van Someren, P Kruit
Scanning|June 7, 2005
Design approach for a multi-beam electron beam-induced deposition systemB van Someren, M J van Bruggen, P Kruit
Ultramicroscopy|October 24, 2017
Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopyI G C Weppelman, R J Moerland, J P Hoogenboom, et al.
Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Ultramicroscopy|December 21, 2002
Low-energy foil aberration correctorR H van Aken, C W Hagen, J E Barth, et al.
Ultramicroscopy|April 12, 2023
In multi electron beam systems, "Neighbours Matter"A Mohammadi-Gheidari, E R Kieft, X Guo, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Ultramicroscopy|August 24, 2010
Design of an aberration corrected low-voltage SEMR H van Aken, D J Maas, C W Hagen, et al.
Structural Dynamics (Melville, N.Y.)|May 9, 2019
Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blankerI G C Weppelman, R J Moerland, L Zhang, et al.
Pageof 3