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P L Potapov

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|June 24, 2014
The experimental electron mean-free-path in Si under typical (S)TEM conditionsP L Potapov
Ultramicroscopy|March 12, 2004
Measuring the absolute position of EELS ionisation edges in a TEMP L Potapov, D Schryvers
Journal of Microscopy|April 16, 2003
Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compoundsP L Potapov, S E Kulkova, D Schryvers
Ultramicroscopy|August 29, 2006
Experiments on inelastic electron holographyP L Potapov, H Lichte, J Verbeeck, et al.
Micron (Oxford, England : 1993)|August 30, 2008
Measuring the dielectric constant of materials from valence EELSP L Potapov, H-J Engelmann, E Zschech, et al.
Ultramicroscopy|January 12, 2007
Inelastic electron holography as a variant of the Feynman thought experimentP L Potapov, J Verbeeck, P Schattschneider, et al.
Nanotechnology|January 18, 2012
Mechanical properties of Bi(x)Sb(2-x)Te3 nanostructured thermoelectric materialG Li, K R Gadelrab, T Souier, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|June 24, 2014
The experimental electron mean-free-path in Si under typical (S)TEM conditionsP L Potapov
Ultramicroscopy|March 12, 2004
Measuring the absolute position of EELS ionisation edges in a TEMP L Potapov, D Schryvers
Journal of Microscopy|April 16, 2003
Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compoundsP L Potapov, S E Kulkova, D Schryvers
Ultramicroscopy|August 29, 2006
Experiments on inelastic electron holographyP L Potapov, H Lichte, J Verbeeck, et al.
Micron (Oxford, England : 1993)|August 30, 2008
Measuring the dielectric constant of materials from valence EELSP L Potapov, H-J Engelmann, E Zschech, et al.
Ultramicroscopy|January 12, 2007
Inelastic electron holography as a variant of the Feynman thought experimentP L Potapov, J Verbeeck, P Schattschneider, et al.
Nanotechnology|January 18, 2012
Mechanical properties of Bi(x)Sb(2-x)Te3 nanostructured thermoelectric materialG Li, K R Gadelrab, T Souier, et al.
Pageof 1