Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Experiments on inelastic electron holography.

P L Potapov1, H Lichte, J Verbeeck

  • 1Electron microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. potapov@ruca.ua.ac.be

Ultramicroscopy
|August 29, 2006
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Long-term outcomes and treatment response in early-stage invasive lobular carcinoma: insights from a nationwide population-based study.

ESMO open·2026
Same author

Fast STEM image simulation in low-energy transmission electron microscopy by the accurate Chen-van-Dyck multislice method.

Micron (Oxford, England : 1993)·2024
Same author

Older adults' compliance with mobile ecological momentary assessments in behavioral nutrition and physical activity research: pooled results of four intensive longitudinal studies and recommendations for future research.

The international journal of behavioral nutrition and physical activity·2024
Same author

Sick leave due to SARS-CoV-2 infection.

Occupational medicine (Oxford, England)·2023
Same author

Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process.

Ultramicroscopy·2022
Same author

Induced giant piezoelectricity in centrosymmetric oxides.

Science (New York, N.Y.)·2022
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
Same journal

Temperature-dependent mean inner potential of polystyrene spheres measured using off-axis electron holography.

Ultramicroscopy·2026
See all related articles

Electron biprism and energy filter measurements reveal that coherence in inelastic scattering decreases with object distance and energy loss. Plasmon scattering coherence in silicon increases with distance from the sample edge in vacuum.

Area of Science:

  • Electron microscopy
  • Quantum optics
  • Materials science

Background:

  • Coherence is crucial for understanding wave-particle duality and advanced imaging techniques.
  • Inelastic scattering in electron microscopy provides information about material electronic structure.
  • Measuring coherence in scattered electron waves is experimentally challenging.

Purpose of the Study:

  • To quantitatively measure the coherence distribution in an inelastically scattered electron wave-field.
  • To investigate the influence of object distance and energy loss on coherence.
  • To study the spatial variation of coherence in a silicon sample.

Main Methods:

  • Utilized a combination of an electron biprism and an energy filter for measurements.
  • Analyzed the coherence of the inelastically scattered electron wave-field.

Related Experiment Videos

  • Examined a silicon (Si) sample to observe plasmon scattering effects.

    • Main Results:

    • The degree of coherence rapidly decreases as the distance between superimposed points in the object increases.
    • Coherence diminishes significantly with increasing energy loss during inelastic scattering.
    • In a silicon sample, the coherence of plasmon scattering was observed to increase in vacuum with the distance from the sample edge.

    Conclusions:

    • Inelastic scattering significantly impacts the coherence of electron wave-fields.
    • Spatial and energy-dependent factors critically influence coherence in electron microscopy.
    • Understanding these coherence effects is vital for interpreting results from advanced electron spectroscopy and imaging techniques.