Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

P S Bate

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Journal of Microscopy|January 3, 2001
Orientation averaging of electron backscattered diffraction dataF J Humphreys, P S Bate, P J Hurley
Journal of Microscopy|November 5, 2005
The characterization of low-angle boundaries by EBSDP S Bate, R D Knutsen, I Brough, et al.
Journal of Microscopy|March 3, 2009
Study of dynamic grain growth by electron microscopy and EBSDO V Rofman, P S Bate, I Brough, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|January 3, 2001
Orientation averaging of electron backscattered diffraction dataF J Humphreys, P S Bate, P J Hurley
Journal of Microscopy|November 5, 2005
The characterization of low-angle boundaries by EBSDP S Bate, R D Knutsen, I Brough, et al.
Journal of Microscopy|March 3, 2009
Study of dynamic grain growth by electron microscopy and EBSDO V Rofman, P S Bate, I Brough, et al.
Pageof 1