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P Vairac

Showing results (1-10 of 6) with videos related to

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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|August 2, 2001
Finite element analysis of the behavior of the Scanning Microdeformation MicroscopeP Vairac, S Ballandras, B Cretin
The Review of Scientific Instruments|September 4, 2007
Sensitive ultrasonic vibrometer for very low frequency applicationsB Cretin, P Vairac, N Jachez, et al.
The Review of Scientific Instruments|April 2, 2008
Piezoelectric and optical setup to measure an electrical field: application to the longitudinal near-field generated by a tapered coaxS Euphrasie, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|April 2, 2008
Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materialsJ Le Rouzic, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|November 5, 2013
Quantitative thermal microscopy using thermoelectric probe in passive modeA Bontempi, L Thiery, D Teyssieux, et al.
The Review of Scientific Instruments|November 30, 2019
Calibration of thermocouple-based scanning thermal microscope in active mode (2ω method)T P Nguyen, L Thiery, S Euphrasie, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|August 2, 2001
Finite element analysis of the behavior of the Scanning Microdeformation MicroscopeP Vairac, S Ballandras, B Cretin
The Review of Scientific Instruments|September 4, 2007
Sensitive ultrasonic vibrometer for very low frequency applicationsB Cretin, P Vairac, N Jachez, et al.
The Review of Scientific Instruments|April 2, 2008
Piezoelectric and optical setup to measure an electrical field: application to the longitudinal near-field generated by a tapered coaxS Euphrasie, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|April 2, 2008
Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materialsJ Le Rouzic, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|November 5, 2013
Quantitative thermal microscopy using thermoelectric probe in passive modeA Bontempi, L Thiery, D Teyssieux, et al.
The Review of Scientific Instruments|November 30, 2019
Calibration of thermocouple-based scanning thermal microscope in active mode (2ω method)T P Nguyen, L Thiery, S Euphrasie, et al.
Pageof 1