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Applied Optics|April 18, 2003
Twin-sensitivity measurement by spatial multiplexing of digitally recorded hologramsPascal Picart, Eric Moisson, Denis MounierJournal of the Optical Society of America. A, Optics, Image Science, and Vision|February 24, 2022
Deep learning speckle de-noising algorithms for coherent metrology: a review and a phase-shifted iterative scheme [Invited]Silvio Montresor, Marie Tahon, Pascal PicartJournal of Imaging|June 23, 2022
Deep Learning Network for Speckle De-Noising in Severe ConditionsMarie Tahon, Silvio Montrésor, Pascal PicartApplied Optics|March 10, 2021
Noise and bias in off-axis digital holography for measurements in acoustic waveguidesLijia Gong, Guillaume Penelet, Pascal PicartJournal of the Optical Society of America. A, Optics, Image Science, and Vision|May 3, 2023
Decorrelation and anti-correlation from defocus in digital holographic interferometryErwan Meteyer, Charles Pezerat, Pascal PicartJournal of the Optical Society of America. A, Optics, Image Science, and Vision|January 13, 2018
Reference-free metric for quantitative noise appraisal in holographic phase measurementsSilvio Montrésor, Pascal Picart, Mayssa KarrayOptometry and Vision Science : Official Publication of the American Academy of Optometry|May 28, 2016
Optical Assessment of Soft Contact Lens Edge-ThicknessPatrice Tankam, Jungeun Won, Cristina Canavesi, et al.Applied Optics|July 21, 2015
Optimization of galvanometer scanning for optical coherence tomographyVirgil-Florin Duma, Patrice Tankam, Jinxin Huang, et al.Optics Express|September 15, 2015
Quantitative phase imaging in flows with high resolution holographic diffraction gratingJean-Michel Desse, Pascal Picart, François OlchewskyOptics Letters|February 5, 2008
High-resolution digital two-color holographic metrologyPascal Picart, Denis Mounier, Jean Michel DessePageof 8