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Paul S Minson

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Ultramicroscopy|January 23, 2023
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering modelsPaul S Minson, Felipe Rivera, Richard Vanfleet
Langmuir : the ACS Journal of Surfaces and Colloids|January 30, 2026
Ambient Pressure Fabrication of Cu<sub><i>x</i></sub>Zn<sub>1-<i>x</i></sub>(BDC)<sub>2</sub>DABCO Thin Films Through Spin-Coating and Their Temperature-Dependent Structural DevelopmentAndrew D Ralph, Russell W Mercer, Seth B Hall, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|January 23, 2023
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering modelsPaul S Minson, Felipe Rivera, Richard Vanfleet
Langmuir : the ACS Journal of Surfaces and Colloids|January 30, 2026
Ambient Pressure Fabrication of Cu<sub><i>x</i></sub>Zn<sub>1-<i>x</i></sub>(BDC)<sub>2</sub>DABCO Thin Films Through Spin-Coating and Their Temperature-Dependent Structural DevelopmentAndrew D Ralph, Russell W Mercer, Seth B Hall, et al.
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