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Optics Express|June 11, 2008
Metrology of optically-unresolved features using interferometric surface profiling and RCWA modelingPeter de Groot, Xavier Colonna de Lega, Jan Liesener, et al.Optics Letters|June 19, 2007
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometryPeter de Groot, Xavier Colonna de LegaApplied Optics|September 29, 2004
Signal modeling for low-coherence height-scanning interference microscopyPeter de Groot, Xavier Colonna de LegaApplied Optics|August 3, 2002
Determination of fringe order in white-light interference microscopyPeter de Groot, Xavier Colonna de Lega, Jim Kramer, et al.Applied Optics|July 9, 2002
Optical interferometry for measurement of the geometric dimensions of industrial partsPeter de Groot, Jim Biegen, Jack Clark, et al.Journal of the Optical Society of America. A, Optics, Image Science, and Vision|September 9, 2020
Fourier optics modeling of interference microscopesPeter J de Groot, Xavier Colonna de LegaApplied Optics|June 10, 2024
Linear systems characterization of the topographical spatial resolution of optical instrumentsPeter J de Groot, Zoulaiha Daouda, Leslie L Deck, et al.Applied Optics|December 2, 2005
Generating fringe-free images from phase-shifted interferometry dataPeter de GrootApplied Optics|December 17, 2009
Design of error-compensating algorithms for sinusoidal phase shifting interferometryPeter de GrootPageof 3