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Nanomaterials (Basel, Switzerland)
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November 11, 2022
Nanometrology
Petr Klapetek
Ultramicroscopy
|
November 13, 2012
One-dimensional autocorrelation and power spectrum density functions of irregular regions
David Nečas, Petr Klapetek
Nanomaterials (Basel, Switzerland)
|
August 7, 2021
Synthetic Data in Quantitative Scanning Probe Microscopy
David Nečas, Petr Klapetek
Ultramicroscopy
|
December 20, 2002
Theoretical analysis of the atomic force microscopy characterization of columnar thin films
Petr Klapetek, Ivan Ohlídal
Scientific Reports
|
September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent it
David Nečas, Miroslav Valtr, Petr Klapetek
Ultramicroscopy
|
November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
Petr Klapetek, Ivan Ohlídal, Jindrich Bílek
Current Protocols
|
January 9, 2025
A Simple Protocol for Visualization of RNA-Protein Complexes by Atomic Force Microscopy
Andrea Tripepi, Huma Shakoor, Petr Klapetek
Nanoscale Research Letters
|
May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurements
Petr Klapetek, Miroslav Valtr, Petr Buršík
Ultramicroscopy
|
May 6, 2015
Methods for topography artifacts compensation in scanning thermal microscopy
Jan Martinek, Petr Klapetek, Anna Charvátová Campbell
Ultramicroscopy
|
March 27, 2019
Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopy
Petr Klapetek, Anna Charvátová Campbell, Vilma Buršíková
Page
of 3
Search research articles
Search
Showing results (1-10 of 30) with videos related to
Sort By:
Page
of 3
Nanomaterials (Basel, Switzerland)
|
November 11, 2022
Nanometrology
Petr Klapetek
Ultramicroscopy
|
November 13, 2012
One-dimensional autocorrelation and power spectrum density functions of irregular regions
David Nečas, Petr Klapetek
Nanomaterials (Basel, Switzerland)
|
August 7, 2021
Synthetic Data in Quantitative Scanning Probe Microscopy
David Nečas, Petr Klapetek
Ultramicroscopy
|
December 20, 2002
Theoretical analysis of the atomic force microscopy characterization of columnar thin films
Petr Klapetek, Ivan Ohlídal
Scientific Reports
|
September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent it
David Nečas, Miroslav Valtr, Petr Klapetek
Ultramicroscopy
|
November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
Petr Klapetek, Ivan Ohlídal, Jindrich Bílek
Current Protocols
|
January 9, 2025
A Simple Protocol for Visualization of RNA-Protein Complexes by Atomic Force Microscopy
Andrea Tripepi, Huma Shakoor, Petr Klapetek
Nanoscale Research Letters
|
May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurements
Petr Klapetek, Miroslav Valtr, Petr Buršík
Ultramicroscopy
|
May 6, 2015
Methods for topography artifacts compensation in scanning thermal microscopy
Jan Martinek, Petr Klapetek, Anna Charvátová Campbell
Ultramicroscopy
|
March 27, 2019
Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopy
Petr Klapetek, Anna Charvátová Campbell, Vilma Buršíková
Page
of 3