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Petr Klapetek

Showing results (1-10 of 30) with videos related to

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Nanomaterials (Basel, Switzerland)|November 11, 2022
NanometrologyPetr Klapetek
Ultramicroscopy|November 13, 2012
One-dimensional autocorrelation and power spectrum density functions of irregular regionsDavid Nečas, Petr Klapetek
Nanomaterials (Basel, Switzerland)|August 7, 2021
Synthetic Data in Quantitative Scanning Probe MicroscopyDavid Nečas, Petr Klapetek
Ultramicroscopy|December 20, 2002
Theoretical analysis of the atomic force microscopy characterization of columnar thin filmsPetr Klapetek, Ivan Ohlídal
Scientific Reports|September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent itDavid Nečas, Miroslav Valtr, Petr Klapetek
Ultramicroscopy|November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfacesPetr Klapetek, Ivan Ohlídal, Jindrich Bílek
Current Protocols|January 9, 2025
A Simple Protocol for Visualization of RNA-Protein Complexes by Atomic Force MicroscopyAndrea Tripepi, Huma Shakoor, Petr Klapetek
Nanoscale Research Letters|May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurementsPetr Klapetek, Miroslav Valtr, Petr Buršík
Ultramicroscopy|May 6, 2015
Methods for topography artifacts compensation in scanning thermal microscopyJan Martinek, Petr Klapetek, Anna Charvátová Campbell
Ultramicroscopy|March 27, 2019
Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopyPetr Klapetek, Anna Charvátová Campbell, Vilma Buršíková
Pageof 3

Showing results (1-10 of 30) with videos related to

Sort By:
Pageof 3
Nanomaterials (Basel, Switzerland)|November 11, 2022
NanometrologyPetr Klapetek
Ultramicroscopy|November 13, 2012
One-dimensional autocorrelation and power spectrum density functions of irregular regionsDavid Nečas, Petr Klapetek
Nanomaterials (Basel, Switzerland)|August 7, 2021
Synthetic Data in Quantitative Scanning Probe MicroscopyDavid Nečas, Petr Klapetek
Ultramicroscopy|December 20, 2002
Theoretical analysis of the atomic force microscopy characterization of columnar thin filmsPetr Klapetek, Ivan Ohlídal
Scientific Reports|September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent itDavid Nečas, Miroslav Valtr, Petr Klapetek
Ultramicroscopy|November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfacesPetr Klapetek, Ivan Ohlídal, Jindrich Bílek
Current Protocols|January 9, 2025
A Simple Protocol for Visualization of RNA-Protein Complexes by Atomic Force MicroscopyAndrea Tripepi, Huma Shakoor, Petr Klapetek
Nanoscale Research Letters|May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurementsPetr Klapetek, Miroslav Valtr, Petr Buršík
Ultramicroscopy|May 6, 2015
Methods for topography artifacts compensation in scanning thermal microscopyJan Martinek, Petr Klapetek, Anna Charvátová Campbell
Ultramicroscopy|March 27, 2019
Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopyPetr Klapetek, Anna Charvátová Campbell, Vilma Buršíková
Pageof 3