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Petr Klapetek

Showing results (11-20 of 30) with videos related to

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Micron (Oxford, England : 1993)|July 21, 2009
50 Hz magnetic field effect on the morphology of bacteriaLukás Fojt, Petr Klapetek, Ludek Strasák, et al.
Ultramicroscopy|October 1, 2016
The development of the spatially correlated adjustment wavelet filter for atomic force microscopy dataAndrzej Sikora, Aleksander Rodak, Olgierd Unold, et al.
Materials (Basel, Switzerland)|February 15, 2019
Optical Properties of Oxidized Plasma-Polymerized Organosilicones and Their Correlation with Mechanical and Chemical ParametersBozena Cechalova, Martin Branecky, Petr Klapetek, et al.
Ultramicroscopy|December 11, 2007
Near-field scanning optical microscope probe analysisPetr Klapetek, Jirí Bursík, Miroslav Valtr, et al.
Nanoscale Research Letters|June 23, 2012
Voice coil-based scanning probe microscopyPetr Klapetek, Miroslav Valtr, Václav Ducho 328, et al.
Nanoscale Research Letters|September 1, 2011
Atomic force microscopy analysis of nanoparticles in non-ideal conditionsPetr Klapetek, Miroslav Valtr, David Nečas, et al.
Optics Express|February 25, 2022
Optical characterization of inhomogeneous thin films with randomly rough boundariesJiří Vohánka, Ivan Ohlídal, Vilma Buršíková, et al.
Methods (San Diego, Calif.)|March 26, 2014
State of the art Raman techniques for biological applicationsAlasdair Rae, Rainer Stosch, Petr Klapetek, et al.
Nanotechnology|June 21, 2011
'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory studyAnna Campbellová, Martin Ondráček, Pablo Pou, et al.
Optics Express|October 19, 2022
Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequenciesIvan Ohlídal, Jiří Vohánka, Vilma Buršíková, et al.
Pageof 3

Showing results (11-20 of 30) with videos related to

Sort By:
Pageof 3
Micron (Oxford, England : 1993)|July 21, 2009
50 Hz magnetic field effect on the morphology of bacteriaLukás Fojt, Petr Klapetek, Ludek Strasák, et al.
Ultramicroscopy|October 1, 2016
The development of the spatially correlated adjustment wavelet filter for atomic force microscopy dataAndrzej Sikora, Aleksander Rodak, Olgierd Unold, et al.
Materials (Basel, Switzerland)|February 15, 2019
Optical Properties of Oxidized Plasma-Polymerized Organosilicones and Their Correlation with Mechanical and Chemical ParametersBozena Cechalova, Martin Branecky, Petr Klapetek, et al.
Ultramicroscopy|December 11, 2007
Near-field scanning optical microscope probe analysisPetr Klapetek, Jirí Bursík, Miroslav Valtr, et al.
Nanoscale Research Letters|June 23, 2012
Voice coil-based scanning probe microscopyPetr Klapetek, Miroslav Valtr, Václav Ducho 328, et al.
Nanoscale Research Letters|September 1, 2011
Atomic force microscopy analysis of nanoparticles in non-ideal conditionsPetr Klapetek, Miroslav Valtr, David Nečas, et al.
Optics Express|February 25, 2022
Optical characterization of inhomogeneous thin films with randomly rough boundariesJiří Vohánka, Ivan Ohlídal, Vilma Buršíková, et al.
Methods (San Diego, Calif.)|March 26, 2014
State of the art Raman techniques for biological applicationsAlasdair Rae, Rainer Stosch, Petr Klapetek, et al.
Nanotechnology|June 21, 2011
'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory studyAnna Campbellová, Martin Ondráček, Pablo Pou, et al.
Optics Express|October 19, 2022
Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequenciesIvan Ohlídal, Jiří Vohánka, Vilma Buršíková, et al.
Pageof 3