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Philip D Rack

Showing results (81-90 of 107) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 28, 2018
Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin FilmsYueying Wu, Chenze Liu, Thomas M Moore, et al.
ACS Applied Materials & Interfaces|April 26, 2019
Low-Temperature Charging Dynamics of the Ionic Liquid and Its Gating Effect on FeSe<sub>0.5</sub>Te<sub>0.5</sub> Superconducting FilmsCheng Zhang, Wei Zhao, Sheng Bi, et al.
Nanotechnology|October 16, 2010
Nanopillar growth by focused helium ion-beam-induced depositionPing Chen, Emile van Veldhoven, Colin A Sanford, et al.
Micromachines|May 28, 2020
Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced DepositionAlex Belianinov, Matthew J Burch, Anton Ievlev, et al.
Optics Express|March 27, 2021
High spatial and energy resolution electron energy loss spectroscopy of the magnetic and electric excitations in plasmonic nanorod oligomersGrace Pakeltis, Enzo Rotunno, Siamak Khorassani, et al.
ACS Nano|May 19, 2025
Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Toward Fully Automated MicroscopyYu Liu, Roger Proksch, Jason Bemis, et al.
Proceedings of the National Academy of Sciences of the United States of America|January 23, 2020
Far-field midinfrared superresolution imaging and spectroscopy of single high aspect ratio gold nanowiresKyle Aleshire, Ilia M Pavlovetc, Robyn Collette, et al.
ACS Applied Materials & Interfaces|February 12, 2024
Selected Area Manipulation of MoS<sub>2</sub> via Focused Electron Beam-Induced Etching for Nanoscale Device EditingJohn Lasseter, Spencer Gellerup, Sujoy Ghosh, et al.
The Review of Scientific Instruments|September 16, 2024
Integration of scanning probe microscope with high-performance computing: Fixed-policy and reward-driven workflows implementationYu Liu, Utkarsh Pratiush, Jason Bemis, et al.
ACS Nano|May 17, 2016
Directing Matter: Toward Atomic-Scale 3D NanofabricationStephen Jesse, Albina Y Borisevich, Jason D Fowlkes, et al.
Pageof 11

Showing results (81-90 of 107) with videos related to

Sort By:
Pageof 11
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 28, 2018
Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin FilmsYueying Wu, Chenze Liu, Thomas M Moore, et al.
ACS Applied Materials & Interfaces|April 26, 2019
Low-Temperature Charging Dynamics of the Ionic Liquid and Its Gating Effect on FeSe<sub>0.5</sub>Te<sub>0.5</sub> Superconducting FilmsCheng Zhang, Wei Zhao, Sheng Bi, et al.
Nanotechnology|October 16, 2010
Nanopillar growth by focused helium ion-beam-induced depositionPing Chen, Emile van Veldhoven, Colin A Sanford, et al.
Micromachines|May 28, 2020
Direct Write of 3D Nanoscale Mesh Objects with Platinum Precursor via Focused Helium Ion Beam Induced DepositionAlex Belianinov, Matthew J Burch, Anton Ievlev, et al.
Optics Express|March 27, 2021
High spatial and energy resolution electron energy loss spectroscopy of the magnetic and electric excitations in plasmonic nanorod oligomersGrace Pakeltis, Enzo Rotunno, Siamak Khorassani, et al.
ACS Nano|May 19, 2025
Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Toward Fully Automated MicroscopyYu Liu, Roger Proksch, Jason Bemis, et al.
Proceedings of the National Academy of Sciences of the United States of America|January 23, 2020
Far-field midinfrared superresolution imaging and spectroscopy of single high aspect ratio gold nanowiresKyle Aleshire, Ilia M Pavlovetc, Robyn Collette, et al.
ACS Applied Materials & Interfaces|February 12, 2024
Selected Area Manipulation of MoS<sub>2</sub> via Focused Electron Beam-Induced Etching for Nanoscale Device EditingJohn Lasseter, Spencer Gellerup, Sujoy Ghosh, et al.
The Review of Scientific Instruments|September 16, 2024
Integration of scanning probe microscope with high-performance computing: Fixed-policy and reward-driven workflows implementationYu Liu, Utkarsh Pratiush, Jason Bemis, et al.
ACS Nano|May 17, 2016
Directing Matter: Toward Atomic-Scale 3D NanofabricationStephen Jesse, Albina Y Borisevich, Jason D Fowlkes, et al.
Pageof 11