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Nanotechnology
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October 17, 2017
Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy
Yunfei Ge, Yuan Zhang, Jonathan M R Weaver, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
February 9, 2005
Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditions
Phillip S Dobson, Lucy A Bindley, Julie V Macpherson, et al.
The Review of Scientific Instruments
|
October 3, 2019
Quantification of atomic force microscopy tip and sample thermal contact
Zarina Umatova, Y Zhang, Ravishkrishnan Rajkumar, et al.
Nanotechnology
|
July 2, 2016
Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size
Yunfei Ge, Yuan Zhang, Jamie A Booth, et al.
Nano Letters
|
April 14, 2005
Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopy
David P Burt, Neil R Wilson, John M R Weaver, et al.
Analytical Chemistry
|
January 15, 2005
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
Phillip S Dobson, John M R Weaver, Mark N Holder, et al.
ACS Applied Materials & Interfaces
|
August 6, 2021
Dynamically Modulated Core-Shell Microfibers to Study the Effect of Depth Sensing of Matrix Stiffness on Stem Cell Fate
Dan Wei, Laura Charlton, Andrew Glidle, et al.
Analytical Chemistry
|
January 2, 2009
Screening of biomineralization using microfluidics
Huabing Yin, Bozhi Ji, Phillip S Dobson, et al.
Physical Chemistry Chemical Physics : PCCP
|
October 13, 2009
Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces
Phillip S Dobson, John M R Weaver, David P Burt, et al.
Optics Letters
|
April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurement
David P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 11) with videos related to
Sort By:
Page
of 2
Nanotechnology
|
October 17, 2017
Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy
Yunfei Ge, Yuan Zhang, Jonathan M R Weaver, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
February 9, 2005
Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditions
Phillip S Dobson, Lucy A Bindley, Julie V Macpherson, et al.
The Review of Scientific Instruments
|
October 3, 2019
Quantification of atomic force microscopy tip and sample thermal contact
Zarina Umatova, Y Zhang, Ravishkrishnan Rajkumar, et al.
Nanotechnology
|
July 2, 2016
Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size
Yunfei Ge, Yuan Zhang, Jamie A Booth, et al.
Nano Letters
|
April 14, 2005
Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopy
David P Burt, Neil R Wilson, John M R Weaver, et al.
Analytical Chemistry
|
January 15, 2005
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
Phillip S Dobson, John M R Weaver, Mark N Holder, et al.
ACS Applied Materials & Interfaces
|
August 6, 2021
Dynamically Modulated Core-Shell Microfibers to Study the Effect of Depth Sensing of Matrix Stiffness on Stem Cell Fate
Dan Wei, Laura Charlton, Andrew Glidle, et al.
Analytical Chemistry
|
January 2, 2009
Screening of biomineralization using microfluidics
Huabing Yin, Bozhi Ji, Phillip S Dobson, et al.
Physical Chemistry Chemical Physics : PCCP
|
October 13, 2009
Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces
Phillip S Dobson, John M R Weaver, David P Burt, et al.
Optics Letters
|
April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurement
David P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Page
of 2