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Phillip S Dobson

Showing results (1-10 of 11) with videos related to

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Nanotechnology|October 17, 2017
Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopyYunfei Ge, Yuan Zhang, Jonathan M R Weaver, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 9, 2005
Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditionsPhillip S Dobson, Lucy A Bindley, Julie V Macpherson, et al.
The Review of Scientific Instruments|October 3, 2019
Quantification of atomic force microscopy tip and sample thermal contactZarina Umatova, Y Zhang, Ravishkrishnan Rajkumar, et al.
Nanotechnology|July 2, 2016
Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable sizeYunfei Ge, Yuan Zhang, Jamie A Booth, et al.
Nano Letters|April 14, 2005
Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopyDavid P Burt, Neil R Wilson, John M R Weaver, et al.
Analytical Chemistry|January 15, 2005
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probesPhillip S Dobson, John M R Weaver, Mark N Holder, et al.
ACS Applied Materials & Interfaces|August 6, 2021
Dynamically Modulated Core-Shell Microfibers to Study the Effect of Depth Sensing of Matrix Stiffness on Stem Cell FateDan Wei, Laura Charlton, Andrew Glidle, et al.
Analytical Chemistry|January 2, 2009
Screening of biomineralization using microfluidicsHuabing Yin, Bozhi Ji, Phillip S Dobson, et al.
Physical Chemistry Chemical Physics : PCCP|October 13, 2009
Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfacesPhillip S Dobson, John M R Weaver, David P Burt, et al.
Optics Letters|April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurementDavid P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Nanotechnology|October 17, 2017
Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopyYunfei Ge, Yuan Zhang, Jonathan M R Weaver, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 9, 2005
Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditionsPhillip S Dobson, Lucy A Bindley, Julie V Macpherson, et al.
The Review of Scientific Instruments|October 3, 2019
Quantification of atomic force microscopy tip and sample thermal contactZarina Umatova, Y Zhang, Ravishkrishnan Rajkumar, et al.
Nanotechnology|July 2, 2016
Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable sizeYunfei Ge, Yuan Zhang, Jamie A Booth, et al.
Nano Letters|April 14, 2005
Nanowire probes for high resolution combined scanning electrochemical microscopy - atomic force microscopyDavid P Burt, Neil R Wilson, John M R Weaver, et al.
Analytical Chemistry|January 15, 2005
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probesPhillip S Dobson, John M R Weaver, Mark N Holder, et al.
ACS Applied Materials & Interfaces|August 6, 2021
Dynamically Modulated Core-Shell Microfibers to Study the Effect of Depth Sensing of Matrix Stiffness on Stem Cell FateDan Wei, Laura Charlton, Andrew Glidle, et al.
Analytical Chemistry|January 2, 2009
Screening of biomineralization using microfluidicsHuabing Yin, Bozhi Ji, Phillip S Dobson, et al.
Physical Chemistry Chemical Physics : PCCP|October 13, 2009
Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfacesPhillip S Dobson, John M R Weaver, David P Burt, et al.
Optics Letters|April 3, 2012
Aperiodic interferometer for six degrees of freedom position measurementDavid P Burt, Phillip S Dobson, Kevin E Docherty, et al.
Pageof 2