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Optics Express|October 7, 2021
Modeling and prediction of tool influence function under complex edge in sub-aperture optical polishingSonglin Wan, Chaoyang Wei, Chen Hu, et al.
Optics Letters|September 15, 2022
Wavefront-coded phase measuring deflectometry for the all-focused measurementZhenqi Niu, Junhua Wang, Yuhan Tian, et al.
Optics Letters|April 28, 2006
Electric field enhancement in guided-mode resonance filtersChaoyang Wei, Shijie Liu, Degang Deng, et al.
Applied Optics|December 1, 2023
Plug-and-play positioning error compensation model for ripple suppressing in industrial robot polishingPandeng Jiang, Songlin Wan, Zhenqi Niu, et al.
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