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Optics Letters|May 20, 2011
Binary amplitude holograms made from dyed photoresistQuandou Wang, Ulf Griesmann, John H BurnettApplied Optics|August 5, 2014
Holographic radius test plates for spherical surfaces with large radius of curvatureQuandou Wang, Ulf Griesmann, Johannes A SoonsOptics Express|October 6, 2012
Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafersJungjae Park, Lingfeng Chen, Quandou Wang, et al.Applied Optics|May 15, 2002
Absolute refractive indices and thermal coefficients of CaF2, SrF2, BaF2, and LiF near 157 nmJohn H Burnett, Rajeev Gupta, Ulf GriesmannApplied Optics|April 2, 2010
Deformation-free form error measurement of thin, plane-parallel optics floated on a heavy liquidJiyoung Chu, Ulf Griesmann, Quandou Wang, et al.Applied Optics|August 24, 2006
Three-flat test solutions based on simple mirror symmetryUlf GriesmannOptics Express|September 13, 2019
Sensing fabrication errors in diffraction gratings using high dynamic range imagingSofia C Corzo-Garcia, Johannes A Soons, Ulf GriesmannSurface Topography : Metrology and Properties|June 14, 2024
Linearizing the vertical scale of an interferometric microscope and its effect on step-height measurementThomas A Germer, T Brian Renegar, Ulf Griesmann, et al.Journal of Research of the National Institute of Standards and Technology|June 9, 2016
Form-Profiling of Optics Using the Geometry Measuring Machine and the M-48 CMM at NISTNadia Machkour-Deshayes, John Stoup, Z Q John Lu, et al.Applied Optics|April 1, 2006
Optical properties of fluids for 248 and 193 nm immersion photolithographySimon G Kaplan, John H BurnettPageof 2