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R Arinero

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|June 20, 2007
New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuumL Portes, M Ramonda, R Arinero, et al.
Nanotechnology|July 29, 2011
Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip-sample distance and dielectric constant dependenceC Riedel, A Alegría, R Arinero, et al.
Ultramicroscopy|August 26, 2011
Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)G A Schwartz, C Riedel, R Arinero, et al.
Ultramicroscopy|March 9, 2010
Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative imagesC Riedel, G A Schwartz, R Arinero, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|April 7, 2010
Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopyC Riedel, R Arinero, Ph Tordjeman, et al.
Scanning|November 8, 2017
Characterization of Dielectric Nanocomposites with Electrostatic Force MicroscopyD El Khoury, V Fedorenko, J Castellon, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|June 20, 2007
New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuumL Portes, M Ramonda, R Arinero, et al.
Nanotechnology|July 29, 2011
Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip-sample distance and dielectric constant dependenceC Riedel, A Alegría, R Arinero, et al.
Ultramicroscopy|August 26, 2011
Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)G A Schwartz, C Riedel, R Arinero, et al.
Ultramicroscopy|March 9, 2010
Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative imagesC Riedel, G A Schwartz, R Arinero, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|April 7, 2010
Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopyC Riedel, R Arinero, Ph Tordjeman, et al.
Scanning|November 8, 2017
Characterization of Dielectric Nanocomposites with Electrostatic Force MicroscopyD El Khoury, V Fedorenko, J Castellon, et al.
Pageof 1