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R Belkorissat

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Micron (Oxford, England : 1993)|June 29, 2004
The effect of beam diameter on the electron skirt in a high pressure scanning electron microscopeR Belkorissat, A Kadoun, B Khelifa, et al.
Micron (Oxford, England : 1993)|April 29, 2005
Electron distribution on a tilted sample in the high pressure SEMR Belkorissat, A Kadoun, B Khelifa, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Micron (Oxford, England : 1993)|June 29, 2004
The effect of beam diameter on the electron skirt in a high pressure scanning electron microscopeR Belkorissat, A Kadoun, B Khelifa, et al.
Micron (Oxford, England : 1993)|April 29, 2005
Electron distribution on a tilted sample in the high pressure SEMR Belkorissat, A Kadoun, B Khelifa, et al.
Pageof 1