Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

R Diaz-Uribe

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Optics Express|May 29, 2009
Phase measurement for segmented optics with 1D diffraction patternsR Diaz-Uribe, A Jiménez-Hernández
Applied Optics|July 1, 1997
Detection limits of an internal-reflection sensor for the optical beam deflection methodA García-Valenzuela, R Diaz-Uribe
Applied and Environmental Microbiology|April 18, 1998
COVASIAM: an image analysis method that allows detection of confluent microbial colonies and colonies of various sizes for automated countingG Corkidi, R Diaz-Uribe, J L Folch-Mallol, et al.
Applied Optics|August 15, 1985
Profile measurement of a conic surface, using a He-Ne laser and a nodal benchR Diaz-Uribe, A Cornejo-Rodriguez, J Pedraza-Contreras, et al.
Applied Optics|May 15, 1986
Cylindrical lenses: testing and radius of curvature measurementJ R Diaz-Uribe, J Pedraza-Contreras, O Cardona-Nunez, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|May 29, 2009
Phase measurement for segmented optics with 1D diffraction patternsR Diaz-Uribe, A Jiménez-Hernández
Applied Optics|July 1, 1997
Detection limits of an internal-reflection sensor for the optical beam deflection methodA García-Valenzuela, R Diaz-Uribe
Applied and Environmental Microbiology|April 18, 1998
COVASIAM: an image analysis method that allows detection of confluent microbial colonies and colonies of various sizes for automated countingG Corkidi, R Diaz-Uribe, J L Folch-Mallol, et al.
Applied Optics|August 15, 1985
Profile measurement of a conic surface, using a He-Ne laser and a nodal benchR Diaz-Uribe, A Cornejo-Rodriguez, J Pedraza-Contreras, et al.
Applied Optics|May 15, 1986
Cylindrical lenses: testing and radius of curvature measurementJ R Diaz-Uribe, J Pedraza-Contreras, O Cardona-Nunez, et al.
Pageof 1