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R E Elmquist

Showing results (1-10 of 5) with videos related to

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Journal of Research of the National Institute of Standards and Technology|November 21, 2017
Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series ConnectionsA Jeffery, R E Elmquist, M E Cage
Journal of Research of the National Institute of Standards and Technology|July 5, 2023
Spectroscopic Study of Quantized Breakdown Voltage States of the Quantum Hall EffectC F Lavine, M E Cage, R E Elmquist
Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect DevicesM E Cage, A Jeffery, R E Elmquist, et al.
The Review of Scientific Instruments|May 3, 2014
Precision high-value resistance scaling with a two-terminal cryogenic current comparatorF L Hernandez-Marquez, M E Bierzychudek, G R Jones, et al.
Journal of Research of the National Institute of Standards and Technology|August 9, 2016
The Ampere and Electrical StandardsR E Elmquist, M E Cage, Y H Tang, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|November 21, 2017
Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series ConnectionsA Jeffery, R E Elmquist, M E Cage
Journal of Research of the National Institute of Standards and Technology|July 5, 2023
Spectroscopic Study of Quantized Breakdown Voltage States of the Quantum Hall EffectC F Lavine, M E Cage, R E Elmquist
Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect DevicesM E Cage, A Jeffery, R E Elmquist, et al.
The Review of Scientific Instruments|May 3, 2014
Precision high-value resistance scaling with a two-terminal cryogenic current comparatorF L Hernandez-Marquez, M E Bierzychudek, G R Jones, et al.
Journal of Research of the National Institute of Standards and Technology|August 9, 2016
The Ampere and Electrical StandardsR E Elmquist, M E Cage, Y H Tang, et al.
Pageof 1