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Ultramicroscopy|July 26, 2002
Improved background-fitting algorithms for ionization edges in electron energy-loss spectraR F Egerton, M MalacMicron (Oxford, England : 1993)|December 27, 2005
Improving the energy resolution of X-ray and electron energy-loss spectraR F Egerton, H Qian, M MalacUltramicroscopy|May 2, 2001
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingY Zhu, R F Egerton, M MalacMicron (Oxford, England : 1993)|March 31, 2023
Transmission electron microscopy of thick polymer and biological specimensR F Egerton, M Hayashida, M MalacMicron (Oxford, England : 1993)|May 4, 2004
Radiation damage in the TEM and SEMR F Egerton, P Li, M MalacMicroscopy Research and Technique|July 22, 2014
Validity of the dipole approximation in TEM-EELS studiesR F Egerton, R A Mcleod, M MalacMicron (Oxford, England : 1993)|November 27, 2007
Fourier-ratio deconvolution and its Bayesian equivalentR F Egerton, F Wang, M Malac, et al.Ultramicroscopy|January 1, 1978
Formulae for light-element microanalysis by electron energy-loss spectrometryR F EgertonMicroscopy (Oxford, England)|November 15, 2017
Calculation, consequences and measurement of the point spread function for low-loss inelastic scatteringR F EgertonUltramicroscopy|January 30, 2007
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopyR F EgertonPageof 4